The Mscan can be configured for high speed inspection of devices using transmitted and reflected illumination simultaneously. The flexible architecture of the Beltronics processor, as described in the Mscan Highlights Section, enables the system to tolerate normal process variation due to spatial expansion, shrinkage and past smear. Figure 23 is the reflected light image of a screened circuit. Figure 24 shows the partial open defect found by the Mscan.

The Mscan can be configured for high speed inspection of devices using transmitted and reflected light simultaneously. T he flexible architecture of the Beltronics processor, as described in the Mscan Highlights Section, enables inspection of a wide range of products. Figures 25 and 26 are images of ITO defects on glass. Figures 27 and 28 are images of chrome defects on glass.