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SYSTEMS FOR
ORGANIC
MATERIALS
• Substrates
• Resists
• Flex Circuits
• Contact Bumps
• Micro Vias
Latest Technology
Topology Map of 200mm x 200 mm 3-Dimensional Sample
SYSTEMS FOR
NON-ORGANIC
MATERIALS
• Silicon Layers
• 3-D Structures
• Screened Paste
• ITO
• Glass Masks
 
SUBSTRATES
Inspection of Organic Substrates
The Mscan detects fatal defects on organic substrates and flex circuits not visible by systems which use reflected light, as explained in the technical section. Figures 7 and 8 show a 2 micron pinhole and a fatal short detected by the Mscan System. Neither of these defects is visible by systems that use reflected light. Figure 9 shows how the Mscan sees the sidewalls of a via and a small speck of metal, not seen by reflected light systems. Such system frequently mask out parts of the via during inspection to avoid confusion and false calls. The Mscan’s superior detection capability overcomes these limitations enabling inspection of the entire via.

Substrates - Reflected Light Image does not show pinhole
Substrates - Mscan finds defect 2 micron pinhole
Reflected Light Image
does not show pinhole
Figure 7a
Mscan finds defect
2 micron pinhole
Figure 7b
Substrates - Reflected light image does not show short
Substrates -Mscan finds defect Fatal short
Reflected light image
does not show short
Figure 8a
Mscan finds defect
Fatal short
Figure 8b
Substrates - Reflected light image does not show metal speck or via sidewalls
Substrates - Mscan finds defect image shows speck and entire via including sidewalks
Reflected light image
does not show metal speck or
via sidewalls
Figure 9a
Mscan finds defect
image shows speck and
entire via including sidewalks
Figure 9b

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